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JS28F256M29EWLA +BOM

Thin small outline package 56-pin

JS28F256M29EWLA General Description

Moreover, this NAND flash memory device features essential functionalities like wear leveling, bad block management, and error correction codes, ensuring data integrity and reliability. Its compact design and low power consumption make it ideal for use in portable and battery-powered devices, making it a dependable choice for demanding applications

Key Features

  • Architecture
  • — Symmetrical 128-Kbyte blocks
  • — 256 Mbit (256 blocks)
  • — 128 Mbit (128 blocks)
  • — 64 Mbit (64 blocks)
  • — 32 Mbit (32 blocks)
  • Performance
  • — 75 ns Initial Access Speed (32,64,128 Mbit densities)
  • — 95 ns Initial Access Speed (256Mbit only)
  • — 25 ns 8-word and 4-word Asynchronous page-mode reads
  • — 32-Byte Write buffer; 4 µs per Byte Effective programming time
  • System Voltage
  • — VCC = 2.7 V to 3.6 V
  • — VCCQ = 2.7 V to 3.6 V
  • Packaging
  • — 56-Lead TSOP (32, 64, 128, 256 Mbit)
  • — 64-Ball Numonyx Easy BGA package (32, 64, 128 and 256 Mbit)
  • Security
  • — Enhanced security options for code protection
  • — 128-bit Protection Register: 64-bits Unique device identifier bits 64-bits User-programmable OTP bits
  • — Absolute protection with VPEN = GND
  • — Individual block locking
  • — Block erase/program lockout during power transitions
  • Software
  • — Program and erase suspend support
  • — Flash Data Integrator (FDI), Common Flash Interface (CFI) Compatible
  • Quality and Reliability
  • — Operating temperature: -40 °C to +85 °C
  • — 100K Minimum erase cycles per block
  • — 0.13 µm ETOX™ VIII Process technology

Specifications

Programmabe Verified Memory Type Non-Volatile
Memory Format FLASH Technology FLASH - NOR
Memory Size 256Mbit Memory Organization 32M x 8, 16M x 16
Memory Interface Parallel Clock Frequency -
Write Cycle Time - Word, Page 110ns Access Time 110 ns
Voltage - Supply 2.7V ~ 3.6V Operating Temperature -40°C ~ 85°C (TA)
Mounting Type Surface Mount

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